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BIST-based diagnosis scheme for field programmable gate array interconnect delay faults

✍ Scribed by Peng, Y.-L.; Wu, C.-W.; Liou, J.-J.; Huang, C.-T.

Book ID: 118681748
Publisher: The Institution of Engineering and Technology
Year: 2007
Tongue: English
Weight: 135 KB
Volume: 1
Category: Article
ISSN: 1751-8601
DOI: 10.1049/iet-cdt:20060197

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