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Bidirectional Reflection Measurements of Periodically Microstructured Silicon Surfaces

โœ Scribed by Y. B. Chen; Q. Z. Zhu; T. L. Wright; W. P. King; Z. M. Zhang


Book ID
111586219
Publisher
Springer
Year
2004
Tongue
English
Weight
444 KB
Volume
25
Category
Article
ISSN
0195-928X

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