Bias voltage dependent shift of the atomic-scale structure of a Ge(111)-(2 × 1) reconstructed surface measured by low temperature scanning tunneling microscopy

✍ Scribed by P. I. Arseyev; N. S. Maslova; V. I. Panov; S. V. Savinov; C. Van Haesendonck

• Book ID: 110168437
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2007
• Tongue: English
• Weight: 235 KB
• Volume: 85
• Category: Article
• ISSN: 0021-3640
• DOI: 10.1134/s0021364007060033