𝔖 Bobbio Scriptorium
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Bias Stress Effect in “Air-Gap” Organic Field-Effect Transistors

✍ Scribed by Y. Chen; V. Podzorov


Book ID
111992419
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
384 KB
Volume
24
Category
Article
ISSN
0935-9648

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