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Bias light induced defect relaxation phenomena in hydrogenated amorphous silicon

✍ Scribed by J.David Cohen; Fan Zhong

Book ID: 115990927
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 433 KB
Volume: 198-200
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(95)00744-x

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