Bias field margin degradation due to long-term memory operation in 16kbit bubble memory chips: N. Yamaguchi Proceedings of the 8th Conference (1976 International) on Solid State Devices, Tokyo, 1976; Japanese Journal of Applied Physics, 16, Supplement 16-1, pp.334–350 (1977)

• Book ID: 108360962
• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 136 KB
• Volume: 10
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(79)80105-6