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Bias and thickness dependence of the infra-red PtSip-Si Schottky diode studied by internal photoemission

✍ Scribed by V.W.L. Chin; J.W.V. Storey; M.A. Green


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
245 KB
Volume
39
Category
Article
ISSN
0038-1101

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