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Bi2Te3-Sb2Te3on polymeric substrate for X-ray detectors based on the seebeck effect

✍ Scribed by J. G. Rocha; L. M. Goncalves; S. Lanceros-Mendez


Publisher
Springer-Verlag
Year
2011
Tongue
English
Weight
485 KB
Volume
18
Category
Article
ISSN
0946-7076

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Angle-resolved X-ray photoelectron spect
✍ Z. Bastl; I. SpirovovΓ‘; J. HorΓ‘k πŸ“‚ Article πŸ“… 1997 πŸ› Elsevier Science 🌐 English βš– 605 KB

An angle-resolved X-ray photoelectron spectroscopy (ARXPS) method is first introduced for elucidation of the mechanism of Te substitution by Se in Sb,Te, crystals. The obtained results are consistent with the substitution of the selenium atoms predominantly into the Te, atomic layers. The observed s