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BENT — software for ray-tracing of X-rays on bent oblique-cut crystals: a comment

✍ Scribed by M. Sanchez del Rio; F. Cerrina


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
137 KB
Volume
301
Category
Article
ISSN
0168-9002

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The X-ray focusing properties of a bent single crystal diffracting in Bragg geometry are discussed. First, it is assumed that a polychromatic point source is focused to a point image. The elliptical arc that the crystal must trace and the aberrations caused by bending the crystal cylindrically are d