Bending strain effects on the critical current in Cu-stabilized IBAD/EDDC processed SmBCO coated conductor tape

✍ Scribed by H.S. Shin; J.R.C. Dizon; R. Bonifacio; T.H. Kim; H.S. Ha; H.S. Kim; S.S. Oh

• Book ID: 108239849
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 341 KB
• Volume: 468
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/j.physc.2008.05.238