Benchmark Tests for MOSFET Compact Models With Application to the PSP Model

✍ Scribed by Xin Li; Weimin Wu; Jha, A.; Gildenblat, G.; van Langevelde, R.; Smit, G.D.J.; Scholten, A.J.; Klaassen, D.B.M.; McAndrew, C.C.; Watts, J.; Olsen, C.M.; Coram, G.J.; Chaudhry, S.; Victory, J.

• Book ID: 114619291
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 513 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.2010570