✦ LIBER ✦
Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps
✍ Scribed by Hidalgo, P; Palais, O; Martinuzzi, S
- Book ID
- 121853765
- Publisher
- Institute of Physics
- Year
- 2003
- Tongue
- English
- Weight
- 363 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0953-8984
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