✦ LIBER ✦
Behaviour of CPW and TFMS lines at high temperature for RF applications in sub-45 nm nodes
✍ Scribed by C. Roda Neve; A. Farcy; M. Gallitre; B. Blampey; P. Meuris; L. Arnaud; J.-P. Raskin
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 626 KB
- Volume
- 87
- Category
- Article
- ISSN
- 0167-9317
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