Behavior of Si Photoelectrodes under High Level Injection Conditions. 2. Experimental Measurements and Digital Simulations of the Behavior of Quasi-Fermi Levels under Illumination and Applied Bias

✍ Scribed by Krüger, Olaf; Kenyon, C. N.; Tan, Ming X.; Lewis, Nathan S.

• Book ID: 127269381
• Publisher: American Chemical Society
• Year: 1997
• Tongue: English
• Weight: 518 KB
• Volume: 101
• Category: Article
• ISSN: 0022-3654
• DOI: 10.1021/jp962484k