Beam test of a dual layer silicon charge detector (SCD) for the CREAM experiment

✍ Scribed by N.H. Park; H.S. Ahn; O. Ganel; J.H. Han; J.A. Jeon; C.H. Kim; K.C. Kim; L. Lutz; M.H. Lee; A. Malinin; S. Nam; I.H. Park; J.H. Park; E.S. Seo; P. Walpole; J. Wu; J. Yang; J.H. Yoo; Y.S. Yoon; S.Y. Zinn

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 366 KB
• Volume: 581
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2007.07.046