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Beam-induced impurity displacement during channelling measurements on phosphorus diffused silicon

✍ Scribed by Allen, C. ;Bicknell, R. W. ;Newman, R. C. ;Peart, R. F. ;Stirland, D. J.


Publisher
John Wiley and Sons
Year
1974
Tongue
English
Weight
219 KB
Volume
22
Category
Article
ISSN
0031-8965

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