Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

✍ Scribed by John H. Thomas III (auth.), Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell (eds.)

Publisher: Springer US
Year: 2002
Tongue: English
Leaves: 451
Series: Methods of Surface Characterization 5
Edition: 1
Category: Library

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✦ Subjects

Characterization and Evaluation of Materials; Optical and Electronic Materials; Analytical Chemistry

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