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Bayesian reliability estimation based on a weibull stress-strength model for aged power system components subjected to voltage surges
✍ Scribed by Chiodo, E.; Mazzanti, G.
- Book ID
- 125496803
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 532 KB
- Volume
- 13
- Category
- Article
- ISSN
- 1070-9878
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