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Bayesian POT modeling for historical data

✍ Scribed by Eric Parent; Jacques Bernier


Book ID
117138821
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
394 KB
Volume
274
Category
Article
ISSN
0022-1694

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In the masked system lifetime data, the exact component that causes the system's failure is often unknown. For each series system at test, we observe its system's failure time and a set of components that includes the component actually causing the system to fail. The objective is to make inferences