✦ LIBER ✦
Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic Devices
✍ Scribed by Tao Yuan; Yue Kuo
- Book ID
- 114668810
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 309 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0018-9529
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