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Barkhausen noise-magnetizing voltage sweep measurement in evaluation of residual stress in hardened components

✍ Scribed by Santa-aho, Suvi; Sorsa, Aki; Hakanen, Merja; Leiviskä, Kauko; Vippola, Minnamari; Lepistö, Toivo

Book ID
127224688
Publisher
Institute of Physics
Year
2014
Tongue
English
Weight
547 KB
Volume
25
Category
Article
ISSN
0957-0233

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Estimation of Biaxial Residual Stress in
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multilayers and single layers of materials indicate that free lattice parameters are different. For Au the differences are smaller than for Ni and this may be caused by differences in the atomic form factor. For Cu/Ni the simulations of the AXRD profiles were also performed for three period stacks,