✦ LIBER ✦
Band-to-Band Tunneling by Monte Carlo Simulation for Prediction of MOSFET Gate-Induced Drain Leakage Current
✍ Scribed by Edwin C. Kan; Venkat Narayanan; Gen Pei
- Book ID
- 110400347
- Publisher
- Springer
- Year
- 2002
- Tongue
- English
- Weight
- 358 KB
- Volume
- 1
- Category
- Article
- ISSN
- 1569-8025
No coin nor oath required. For personal study only.