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Band line-up determination at p- and n-type Al/4H-SiC Schottky interfaces using photoemission spectroscopy

✍ Scribed by Kohlscheen, J.; Emirov, Y. N.; Beerbom, M. M.; Wolan, J. T.; Saddow, S. E.; Chung, G.; MacMillan, M. F.; Schlaf, R.


Book ID
121390745
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
463 KB
Volume
94
Category
Article
ISSN
0021-8979

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