✦ LIBER ✦

Ballistic-electron-emission spectroscopy

✍ Scribed by H. von Känel; M. Klemenc; T. Meyer

Book ID: 106023935
Publisher: Springer
Year: 2001
Tongue: English
Weight: 382 KB
Volume: 72
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s003390100749

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Theory of ballistic electron emission sp

Theory of ballistic electron emission spectroscopy of NiSi2Si(111) interfaces

✍ M.D. Stiles; D.R. Hamann 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 589 KB

Ballistic Electron Emission Microscopy o

Ballistic Electron Emission Microscopy on Quantum Wires

✍ J. Smoliner; C. Eder; G. Strasser; E. Gornik 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 204 KB 👁 1 views

Ballistic electron emission testing of s

Ballistic electron emission testing of semiconductor heterostructures

✍ Gregory N. Henderson; Thomas K. Gaylord; Elias N. Glytsis; Phillip N. First; Wil 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 510 KB

Probing heterojunctions by ballistic ele

Probing heterojunctions by ballistic electron emission microscopy

✍ A.E. Fowell; A.A. Cafolla; B.E. Richardson; T.-H. Shen; M. Elliott; D.I. Westwoo 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 750 KB

Gate oxide characterization with Ballist

Gate oxide characterization with Ballistic Electron Emission Microscopy

✍ R. Ludeke; H.J. Wen 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 697 KB

Ballistic Electron Emission Microscopy (BEEM) is shown to be a versatile new tool for the study of hot electron phenomena in metal-oxide-semiconductor structures. The elusive problem of measuring oxide charge distributions is largely overcome by suitable modeling of the field dependent threshold shi

Spontaneous emission by ballistic electr

Spontaneous emission by ballistic electrons in semiconducting heterostructures

✍ M. Botton; A. Ron 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 397 KB