𝔖 Bobbio Scriptorium
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Ballistic electron emission microscopy using InAs tips

✍ Scribed by Smoliner, J.; Heer, R.; Eder, C.


Book ID
113035235
Publisher
Springer
Year
1998
Tongue
English
Weight
131 KB
Volume
66
Category
Article
ISSN
1432-0630

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Ballistic Electron Emission Microscopy (BEEM) is shown to be a versatile new tool for the study of hot electron phenomena in metal-oxide-semiconductor structures. The elusive problem of measuring oxide charge distributions is largely overcome by suitable modeling of the field dependent threshold shi