Backward deviation and depth recovery of load–displacement curves of amorphous SiC film under repeating nanoindentation

✍ Scribed by T Dharma Raju; Masahiko Kato; Keijiro Nakasa

• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 341 KB
• Volume: 51
• Category: Article
• ISSN: 1359-6454
• DOI: 10.1016/s1359-6454(03)00176-9