Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks: D.H. Krinsley, K. Pye, S. Boggs, Jr., N.K. Tovey

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• Book ID: 110258015
• Publisher: Springer Netherlands
• Year: 2000
• Tongue: English
• Weight: 50 KB
• Volume: 23
• Category: Article
• ISSN: 0921-2728
• DOI: 10.1023/a:1008057704505