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Background subtraction practice in X-ray reflectivity reciprocal space mapping and its influence on the structural parameters of thin films

✍ Scribed by A. Fouzri; F. Salah; N. Mtiraoui; B. Harzallah; M. Oumezzine


Book ID
114989258
Publisher
Springer
Year
2012
Tongue
English
Weight
378 KB
Volume
55
Category
Article
ISSN
0020-4412

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