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Background analysis and its correction for X-ray stress measurement : Li Jiabao; Sun Yanjun Residual stresses in science and technology. Proceedings of the international conference, Garmisch-Partenkurchen (FRG), Oct. 1986. pp. 127–134. Deutsche Gesellschaft fur Metallkunde, 1059 pp. (1987)

Publisher: Elsevier Science
Year: 1989
Weight: 162 KB
Volume: 22
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(89)91183-8

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