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Back surface reflected electroabsorption as a new characterization method of internal potential in a-Si homo- and heterojunction

✍ Scribed by Shuichi Nonomura; Koji Fukumoto; Hiroaki Okamoto; Yoshihiro Hamakawa

Book ID: 118332139
Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 183 KB
Volume: 59-60
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(83)90358-7

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