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Back-end-of-line compatible Conductive Bridging RAM based on Cu and SiO2

✍ Scribed by Y. Bernard; V.T. Renard; P. Gonon; V. Jousseaume


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
456 KB
Volume
88
Category
Article
ISSN
0167-9317

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