✦ LIBER ✦
Back Cover: Monitoring of the growth of microcrystalline silicon by plasma-enhanced chemical vapor deposition using in-situ Raman spectroscopy (Phys. Status Solidi RRL 4/2011)
✍ Scribed by S. Muthmann; F. Köhler; M. Meier; M. Hülsbeck; R. Carius; A. Gordijn
- Book ID
- 112183346
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 487 KB
- Volume
- 5
- Category
- Article
- ISSN
- 1862-6254
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