B. R. Pamplin †, P. Krishana (eds). Recent advances in X-ray characterization of materials. Progress in Crystal Growth and Characterization, vol. 14. Pergamon Press, Oxford/New York/Beijing/Frankfurt/Sao Paulo/Sydney/Tokyo/Toronto 1987, 514 p., Bibliography, Subject and Compound Index. DM 300.—

✍ Scribed by W. Schmitz

• Publisher: John Wiley and Sons
• Year: 1987
• Tongue: English
• Weight: 63 KB
• Volume: 22
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.2170221228