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Axial development of interfacial area and void concentration profiles measured by double-sensor probe method

โœ Scribed by W.H. Leung; S.T. Revankar; Y. Ishii; M. Ishii


Book ID
107759657
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
776 KB
Volume
38
Category
Article
ISSN
0017-9310

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