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Automating test generation for discrete event oriented embedded systems

✍ Scribed by Steven J. Cunning; Jerzy W. Rozenblit

Book ID: 106387946
Publisher: Springer Netherlands
Year: 2005
Tongue: English
Weight: 430 KB
Volume: 41
Category: Article
ISSN: 0921-0296
DOI: 10.1007/s10846-005-3810-8

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