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Automatic Test Program Generation Using Executing-Trace-Based Constraint Extraction for Embedded Processors

✍ Scribed by Zhang, Ying; Li, Huawei; Li, Xiaowei

Book ID: 120321387
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 924 KB
Volume: 21
Category: Article
ISSN: 1063-8210
DOI: 10.1109/TVLSI.2012.2208130

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