✦ LIBER ✦
Automatic statistical full quantum analysis of C-V and I-V characteristics for advanced MOS gate stacks
✍ Scribed by C. Leroux; F. Allain; A. Toffoli; G. Ghibaudo; G. Reimbold
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 486 KB
- Volume
- 84
- Category
- Article
- ISSN
- 0167-9317
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