[Automatic RF Tech. Group 52nd ARFTG Conference Digest. Automatic RF Techniques Group. Computer-Aided Design and Test for High-Speed Electronics - Rohnert Park, CA, USA (3-4 Dec. 1998)] 52nd ARFTG Conference Digest. Automatic RF Techniques Group. Computer-Aided Design and Test for High-Speed Electronics (IEEE Cat. No.98EX245) - Automated characterization of ceramic multilayer capacitors

✍ Scribed by Benabe, E.; Skowronski, K.; Weller, T.; Gordon, H.; Warder, P.

• Book ID: 126748020
• Publisher: Automatic RF Tech. Group
• Year: 1998
• Tongue: English
• Weight: 434 KB
• Category: Article
• ISBN-13: 9780780356863
• DOI: 10.1109/ARFTG.1998.768629