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Automatic optical inspection for detecting defects on printed circuit board inner layers

✍ Scribed by H. Rau; C.-H. Wu


Book ID
105851019
Publisher
Springer
Year
2005
Tongue
English
Weight
574 KB
Volume
25
Category
Article
ISSN
0268-3768

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πŸ“œ SIMILAR VOLUMES


Analogic algorithms for optical detectio
✍ Szolgay, PΓ©ter; TΓΆmΓΆrdi, Katalin πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 146 KB

Printed circuit board layout inspection methods are mostly based on local geometric information, therefore they are well suited to the CNN paradigm. Here the detection of two layout errors is considered namely, the breaks in the wires and some kind of short circuits. The designed analogic algorithms