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Automatic fault diagnosis for scan-based designs

✍ Scribed by Matthias Heinitz; Ingo Hollenbeck; Martin Kuboschek; Jan Otterstedt; Christian Sebeke; Thomas Winkel

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 594 KB
Volume: 31
Category: Article
ISSN: 0167-9317
DOI: 10.1016/0167-9317(95)00355-x

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