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Automatic current spectroscopy of semiconductors and dielectrics

โœ Scribed by Yu. N. Potapovich; T. V. Panchenko; G. V. Snezhnoi


Book ID
105023378
Publisher
Springer US
Year
1992
Tongue
English
Weight
324 KB
Volume
35
Category
Article
ISSN
0543-1972

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๐Ÿ“œ SIMILAR VOLUMES


Admittance and dielectric spectroscopy o
โœ Paulo R. Bueno; Josรฉ A. Varela; Elson Longo ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 713 KB

This text discusses about advantageous, powerful and limitations of admittance and dielectric spectroscopy in the characterization of polycrystalline semiconductors. In the context of polycrystalline semiconductors or dielectric materials, the admittance or dielectric frequency response analyses are