Admittance and dielectric spectroscopy o
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Paulo R. Bueno; Josรฉ A. Varela; Elson Longo
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Article
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2007
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Elsevier Science
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English
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This text discusses about advantageous, powerful and limitations of admittance and dielectric spectroscopy in the characterization of polycrystalline semiconductors. In the context of polycrystalline semiconductors or dielectric materials, the admittance or dielectric frequency response analyses are