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Automatic CoDec generation to reduce test engineering cost

✍ Scribed by Ariel Sabiguero; Anthony Baire; César Viho

Publisher: Springer
Year: 2008
Tongue: English
Weight: 582 KB
Volume: 10
Category: Article
ISSN: 1433-2779
DOI: 10.1007/s10009-008-0073-2

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