𝔖 Bobbio Scriptorium

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Automated vision system for inspection of IC pads and bonds : Koduri K. Sreenivasan et al. IEEE Transactions on Components, Hybrids and Manufacturing Technology, 16(3), 333 (May 1993)

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 105 KB
Volume: 34
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(94)90321-2

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