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Automated two-dimensional strain analysis from deformed elliptical markers using an image analysis system

✍ Scribed by Kyuichi Kanagawa

Book ID: 113292678
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 448 KB
Volume: 12
Category: Article
ISSN: 0191-8141
DOI: 10.1016/0191-8141(90)90055-4

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