✦ LIBER ✦
Automated synthesis of pseudo-exhaustive test generator in VLSI BIST design : Chien-in Henry Chen and Joel T. Yuen. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2, 3, 273 (September 1994)
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 115 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0026-2714
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