Automated structure factor refinement from convergent-beam patterns
β Scribed by J.M. Zuo; J.C.H. Spence
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 914 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0304-3991
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The method for accurate structure refinement from energy-filtered convergentbeam electron diffraction (CBED) patterns is described with emphasis on recent progress in using imaging filters and 2-D detectors. Details are given about the underlying theoretical model and the statistical analysis of exp
Provided that multiple reflection is present, a common occurrence with electron diffraction on microcrystallites, a single unindexed convergent-beam electron diffraction (CBED) pattern taken with the beam axis parallel to any direct lattice row allows the volume of the primitive cell to be calculate