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Automated structure factor refinement from convergent-beam patterns

✍ Scribed by J.M. Zuo; J.C.H. Spence


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
914 KB
Volume
35
Category
Article
ISSN
0304-3991

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The method for accurate structure refinement from energy-filtered convergentbeam electron diffraction (CBED) patterns is described with emphasis on recent progress in using imaging filters and 2-D detectors. Details are given about the underlying theoretical model and the statistical analysis of exp

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Provided that multiple reflection is present, a common occurrence with electron diffraction on microcrystallites, a single unindexed convergent-beam electron diffraction (CBED) pattern taken with the beam axis parallel to any direct lattice row allows the volume of the primitive cell to be calculate