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Automated setup for thermal imaging and electrical degradation study of power DMOS devices

✍ Scribed by M. Heer; V. Dubec; M. Blaho; S. Bychikhin; D. Pogany; E. Gornik; M. Denison; M. Stecher; G. Groos

Book ID: 108210586
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 682 KB
Volume: 45
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2005.07.082

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