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Automated measuring instrument of the surface electric potential and potential distribution

โœ Scribed by Sakalauskas, S.; Sodeika, A.


Book ID
120083036
Publisher
American Institute of Physics
Year
1998
Tongue
English
Weight
365 KB
Volume
69
Category
Article
ISSN
0034-6748

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The combination of atomic force microscopy (AFM) and Kelvin probe technology is a powerful tool to obtain high-resolution maps of the electric surface potential distribution on conducting and non-conducting samples. We show that potential maps of composite metal รlms and semiconductors show a clear