Automated jet polishing of transmission electron microscope specimens for in situ straining

✍ Scribed by Hardiman, B. ;Clark, W. A. T. ;Wagoner, R. H.

• Publisher: Wiley (John Wiley & Sons)
• Year: 1987
• Tongue: English
• Weight: 310 KB
• Volume: 5
• Category: Article
• ISSN: 0741-0581
• DOI: 10.1002/jemt.1060050210

✦ Synopsis

A jet-polishing technique has been developed for use in the preparation of microtensile specimens for HVEM examination. The technique requires the use of a pair of Teflon sheet inserts with rectangular openings in a conventional specimen holder. When inserts with optimum opening dimensions are used, specimens having elliptical holes close to the center of the gauge section are produced with large electron-transparent areas at both ends of the long axis. Annealed metal specimens, such as brass or aluminum, prepared by this method are stronger, and can be handled more easily, than those prepared by conventional methods. An advantage of the technique is that reproducible electropolishing conditions and the automatic detection of perforation by a photocell can be used in the normal way.