✦ LIBER ✦
Automated defect recognition of C-SAM images in IC packaging using Support Vector Machines
✍ Scribed by Y.L. Zhang; N. Guo; H. Du; W.H. Li
- Publisher
- Springer
- Year
- 2004
- Tongue
- English
- Weight
- 291 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0268-3768
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